Polymers for Microelectronics and Nanoelectronics

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Collecting P. Barnum P. For this, the application scope of X-ray-based methods is extended to approx.

These methods enable non-destructive examination of structural and functional materials on a microscopic scale with a resolution of up to approx. Imaging of pores, inclusions, and cracks in composite materials e. Objects larger than the field of view max.

Polymers for Microelectronics and Nanoelectronics (ACS Symposium Series)

Especially for low-density materials, the contrast can be enhanced using the Zernike phase contrast technique. This allows for better visualization of interfaces and surfaces as well as delaminated regions and cracks.


  • Polymers For Microelectronics And Nanoelectronics;
  • Editorial board.
  • 101 Uses for a Dead Cat!
  • Materials Synthesis and Processing Section (6123).
  • Microelectronics and nanoelectronics testing?
  • Materials Synthesis and Processing Section () | Chemistry Division.

With miniaturized thermal and mechanical testing devices situated in the beam path of the X-ray microscope, both threedimensional and four-dimensional data can be acquired in experiments.